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August, 2009

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MI Technologies Purchases Assets of IAM Systems, Inc.

MI Technologies has purchased assets and exclusive rights for products and designs from IAM Systems, Inc. who is an international provider of microwave reflector systems. As part of this move, Bill Griffin, IAM’s owner and principal, will be joining the MI Technologies team. This combination of product techniques and expertise between MI Technologies and IAM Systems further expands MI Technologies strength as being the most comprehensive provider of compact ranges worldwide.

Click here to read the full story.

MI Technologies Launches
MI-3064 Time Domain Analysis Software

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See MI Technologies in Booth 3
at the 2009 Antenna Systems Conference
September 1-2, 2009
Philadelphia, PA.
We look forward to seeing you there.
Click here for the link to register.

Accelerating Over-the-Air Testing of Devices with Small Antennas: An Alternative Approach to Antenna Pattern Measurements
Jeff Fordham’s presentation at the 2009 Antenna Systems Conference, September 1-2, in Philadelphia, will challenge the traditional mindset that antenna patterns are necessary for accurate antenna testing. Jeff Fordham, as presenter, will show that collecting antenna patterns on small antennas such as those used in mobile phones, WLAN equipment, PDAs and Bluetooth devices, are unnecessary. Hear about an accurate way to measure these small antennas that is up to 20 times faster vs. antenna pattern collection.

AMTA 2009 in Salt Lake City is not far away. Click here for more information. Visit MI Technologies in the Casper Room on the Main Level for exciting products and systems. Look for our experts leading sessions throughout the conference.

Technical Paper Download

An Apparent Discrepancy Between Impedance Mismatch Factors for Near-Field and Far-Field Measurements In making accurate measurements of antenna gain, one must correct for the impedance mismatches among: 1) the signal generator and transmitting antenna, 2) between the receiving power sensor and the receiving antenna and 3) between the signal generator and receiving power sensor.

MI Technologies’ Dr. Doren Hess discusses the importance of the impedance mismatch correction to microwave antenna measurements and compares the correction methods for the near-field voltage domain to the far-field power domain.

Spherical Near-Field Antenna Measurement Note: Insertion Loss Gain Measurement. Spherical near-field (SNF) antenna measurement theory supports antenna gain determination through range insertion loss measurement. As an absolute antenna gain measurement method, temptation of its application in routine antenna measurement grows stronger with proliferation of SNF antenna measurement. For many end users of a SNF system, however, the connection between antenna gain and measurement of scan data and insertion loss may not always be immediately obvious, given the complexity of SNF theory and formulations involved.

MI Technologies’ Brian Tian’s review serves as a necessary basis for discussing the relationship of gain and insertion loss parameters, as well as their measurement practice.