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Measurement Applications
Microwave Instruments
Microwave Components
Precision Motion
and Positioning
Automated Test
Equipment
Customer Support

For more information
about
MI Technologies products, systems and
services email us,
dial +1-678-475-8300
or visit
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December 2009
MI Technologies in the News
MI-3046 Spherical Near-Field Software Released
Click here for the story and link.
New Version of MI-3000 Data Acquisition and Analysis
Software for Classic and Arena Released
Click here for the story and link.
MI Technologies Receives Best Paper Award
at LAPC 2009 in the UK
Click here for the story and link.
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ATMS India in New Dehli.
Join MI Technologies in New Dehli, India at the Antenna Test and Measurement Society show February 11-13, 2010.
www.atmsindia.org. |
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The AMTA 2009 Conference, in Salt Lake City in early November, proved to be one of the most successful exhibitions in recent history. Though there was some concern about attendance due to the economy, we found the conference well-attended with both old and new attendees and participants.
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Our experts led numerous sessions throughout the
conference:
- A paper on Numerical Calibration of Standard Gain Horns authored by Dr. Donald Bodnar, of MI Technologies was presented.
- A Nonredundant NF-FF Transformation with Spherical Spiral Scanning Using a Flexible AUT Model was presented by Dr. Francesco D'Agostino of the University of Salerno.
- Dr. Doren Hess, with MI Technologies, presented An Evaluation of the Aperture Backprojection Technique Using Measurements Made on a Flat Plate Array with a Spherical Near-Field Arch
- Insights on MIMO Over-the-Air Testing of Wireless Units in Reverberation Chamber was presented for Charlie Orlenius and Mats Andersson,
CEO our partners at Bluetest SE.
- David Wayne, VP of Engineering with MI Technologies, presented a paper on
Portable RF Target Simulators on the last day of the conference.
Continue to watch for upcoming Communicators and MI's website,
www.mi-technologies.com, for download opportunities of these various papers.
Many of you met with Bill Griffin who recently joined MI's technical community. Bill's expertise provided attendees with insights into the features and benefits of the rolled edge reflector design and technique.
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We look forward to meeting you in 2010 in Atlanta for an even more progressive conference as MI continues to bring new and innovative services and products to market. |
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Technical Paper Download - LAPC 2009 Best Paper Award
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LAPC is the largest conference dedicated to antenna technology in the U.K. It has been growing over the years as it attracts a variety of organizations such as IEEE, ESA, EurAAP, and prominent U.K. technical universities.
One of two Best Paper Prize awards was received by Doren Hess for his paper, co-authored with Scott McBride, entitled
"An Aperture Back-Projection Technique and Measurements Made on a Flat Plate Array with a Spherical Near-Field Arch"
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The awarded paper describes two
theoretical bases for an algorithm for
back-projection. The first is (1) Fourier
inversion of the mathematical expression for the
far electric field components in terms of the
aperture electric field. The second is (2)
Fourier inversion of the complete vectorial
transmitting characteristic of Kerns' scattering
matrix. |
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S-WareCareTM Brings Superior Software Maintenance for Your Peace of Mind
Range performance in your operation is of utmost importance. Accurate and precise operations depend on well maintained hardware and software. Don't wait only to find you've got a demanding project that puts you under pressure.
MI Technologies S-WareCareTM puts you in the position to protect your software investment and ensures your users have the latest technology and capabilities to deliver, not only high system performance, but access to measurement experts who provide you diagnostic and technical assistance so you can continue to
Test With Confidence.
For more information, contact MI Technologies' Customer Support Service Center at +1-678-475-8300, Option 4.
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Plan Element
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S-WareCare
Service Plan |
Standard
Software
Warranty |
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Coverage Period
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One Year |
90 Days |
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Telephone Technical
Support
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New Software Releases
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Bug Corrections
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Renewal Provisions
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Discounts on:
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MI Technologies continues to focus on our commitment to the advancement of microwave test and measurement. The strategic vision of the company is for expansion and growth. Just recently, we announced the inclusion of IAM Systems' services and products into our own suite of products and the opening of a
European office near London, U.K. and we prominently presented our color change schemes in our AMTA 2009 booth. Look for more changes as we move to our new website in early 2010.
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