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December 15, 2006
www.mi-technologies.com
MI Technologies Introduces the
IsoFilterTM Antenna Measurement Technique at AMTA
 Dr.
Doren Hess, Senior Staff Engineer at MI Technologies, introduced a
new analysis technique for antenna measurements at the 2006 AMTA
(Antenna Measurement Techniques Association) symposium. Dr. Hess
prepared two technical papers, to present the IsoFilterTM
technique to the antenna test and measurement community. The IsoFilterTM
technique provides for suppression and elimination of
the effects of unwanted extraneous signals within patterns produced
by spherical near-field scanning and analysis. Practical applications
for MI Technologies' IsoFilterTM technique include telematics
where antennas, mounted on vehicles, present complex measurement
situations.
In this first segment of a two-part
series, the MI Communicator offers links to Dr. Hess' first paper
"The IsoFilterTM Technique: Isolating an Individual Radiator
from Spherical Near-Field Data Measurement in a Contaminated
Environment." In this paper, Dr. Hess describes the novel method
of isolating the radiation pattern of an individual radiator from
among a composite set of radiators that form a complex radiation
distribution. The end result is to yield an approximate pattern of
the individual radiator largely uncontaminated by the other
competing sources of radiation.
Click here to download the paper.
Dr. Hess' second paper in the series "The IsoFilterTM
Technique: Extension to Transverse Offsets" will be featured in
the January 2007 MI Communicator.
AMTA 2006: Engineering
Solutions and Top Products Highlighted
MI Technologies' Solutions Center Provides
Practical Advice for AMTA Attendees
 MI
Technologies Solutions Center, introduced at AMTA 2006, offered
free, focused engineering consultations on a wide range of test and
measurement issues during AMTA 2006.
Participants discussed
antenna, radar cross-section, radome measurement and test range
issues with MI Technologies engineers.
Jeff Fordham,
Vice President of Marketing for MI Technologies, said, "Our
Solutions Center provided an opportunity for those attending AMTA to
meet with our test and measurement experts to work out solutions to
their real-world test and measurement problems issues such as range
layouts, types of test and measurement systems, test range
automation, difficult measurement tasks and errors and accuracy
problems."
A full schedule
of meetings was held Monday through Wednesday during AMTA. "The
Solutions Center was very successful," Fordham added. We plan to
make it a regular feature of our AMTA program in years to come."
Products, Systems
and Software Featured
MI Technologies' antenna test and measurement products drew in
crowds to the 'Sabine' demonstration during AMTA 2006.
Attendees saw:
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A
functioning Planar Near-Field/Cylindrical Near-Field test and
measurement station
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A Spherical
Near-Field test and measurement station set up for measurements
between 12.4-18 GHz
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An MI-502D
Corner Fed Compact Range Demonstration and
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Live
demonstrations of the new MI-3000 V3.3 Software
 Each
of the test and measurement displays included an MI-2097 Automated
Microwave Measurement System consisting of the MI-3000 Data
Acquisition and Analysis Workstation, the MI-4190 Position
Controller, MI-3111 High Performance Synthesized Source and MI-1797
Microwave Receiver. The MI-6900 scanner was featured in the Planar
and Cylindrical Near-Field station.
Click here for more information on the MI-2097 AMMS.
Technical Papers
Highlight Seminars:
MI Technologies engineers delivered five technical papers during the
conference on such topics as Near-Field Measurements, RF
Measurements and Range Design and Evaluation. Click on the titles
below to download the papers.
"A Note to Show How an
Alternative Spherical Mode Normalization Simplifies the Relationship
Between Transmitting and Receiving Characteristics," Dr. Doren Hess
"The
IsoFilterTM Technique: Isolating an Individual Radiator From
Spherical Near-Field Data Measured in a Contaminated Environment,"
Dr. Doren Hess
"The IsoFilterTM Technique: Extension to Transverse Offsets,"
Dr. Doren Hess
"Results of A
New RF Cable Correction Method," Scott McBride
"The Impact of
Local Area Networks on Antenna Measurement Range Design,"
Marion Baggett
EuCAP Leads European Focus
on Antenna Measurement
 In
November, MI Technologies and its French Sales and Services
Representative, Actions and Services, exhibited together at EuCAP
2006 in Nice, France.
EuCAP,
the first European Conference on Antennas and Propagation, is
organized by the European Network of Excellence ACE, under the EU
6th Framework Program. The conference is also co-sponsored by the
European Space Agency (ESA).
Dr.
Carlo Rizzo, Director of European Operations for MI Technologies,
said, "EuCAP provides a forum for more than 1,000 professionals in
research and development, antennas and propagation to exchange of
scientific and technical information and to foster collaboration and
cooperation at European and global levels.
MI
Technologies conducted live demonstrations of a Spherical Near-Field
antenna test and measurement station which featured the MI-2097
Automated Microwave Measurement System.
MI-3000 Version 3.3 Data Acquisition and
Analysis Software Available
 MI
Technologies' new MI-3000 Version 3.3 Data Acquisition and Analysis
Software includes a number of new features to enhance test and
measurement acquisition, plotting and data file analysis.
The new features
in the
MI-3000 V3.3 Data Acquisition and Analysis Software help users
acquire, plot and analyze data by making the functions easier to
perform and more intuitive to use.
Among the new features of the MI-3000 V3.3 are:
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An interface
to MATLAB® has been added to assist users of MATLAB
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Support for
Agilent's E8257 PSG Signal Source
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Front-to-back
ratio analysis for single scans or hemispheres of data
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A memory
function in support of the MI-3101/2 signal sources for large
frequency sets to minimize initialization times
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Sizable plot
windows
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A
'rubber-band' zoom function
MI-Technologies
MI-3000 software applications control and collect data from a wide
variety of MI Technologies' and third-party test and measurement
instruments, including the MI-2097 Automated Microwave Measurement
System. Common user interfaces and separate software drivers for
each instrument provide a flexible platform to allow users to
configure the best measurement system to meet their test
requirements.
Click
Here to download the MI-3000 brochure
Click Here to download the MI-2097 Automated Microwave
Measurement System data sheet
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