See MI Technologies at the 2006 IEEE AP-S Symposium and AMTA/IEEE Regional Colloquium

July 6, 2006

See MI Technologies at the 2006 IEEE AP-S Symposium and AMTA/IEEE Regional Colloquium

ATLANTA: MI Technologies will showcase its test and measurement capabilities at the 2006 IEEE AP-S International Symposium July 9-14 in Albuquerque, New Mexico and the Second Annual AMTA/IEEE Colloquium in Denver, Colorado, Friday, July 21.

At the IEEE AP-S International Symposium, the Company will occupy Booth #33 and provide information on its antenna, radome and radar cross section test and measurement products, its automated measurement systems, software and custom engineering services. Click here for more information about the IEEE AP-S Symposium.

At the AMTA/IEEE Regional Colloquium, Dr. Donald Bodnar, Vice President of Business Development MI Technologies, will present a lecture on "Near-Field Antenna Measurements for Wireless System Devices." The Company will also host a tabletop exhibit at the one-day event. Click here for more information about the AMTA/IEEE Regional Colloquium.