Dr.
Donald G. Bodnar, Vice President of MI Technologies will conduct a technical
presentation entitled "Far-Field Test Methods: Indoor, Outdoor and Compact
Ranges" at the
ICRS-2008 Conference
in Jodhpur, India February 28-29 and also at the Antenna Test and Measurement
Society (ATMS), Seminar held in Bangalore March 3-4In his presentation, Dr. Bodnar will review the advantages Far-Field antenna measurements have over other measurement techniques. Both large and small antennas can be tested and measurements can be performed over a wide frequency range in the Far-Field. In addition, Far-Field measurements can be performed in a compact range or a free space range indoors or out doors. Instrumentation used in Far-Field measurements will also be included in his talk.
In his role as Vice President at MI Technologies, Dr. Bodnar focuses on new business and new product development for the wireless and near-field antenna measurements.
He holds a doctorate degree and a bachelor's degree in electrical engineering from the Georgia Institute of Technology and a master's degree in electrical engineering from the Massachusetts Institute of Technology. Dr. Bodnar has taught graduate and undergraduate courses at the Georgia Institute of Technology in antennas, electromagnetic theory, materials and computer programming. He is a Fellow of the IEEE, a Past President and a Past Vice President of the IEEE Antennas and Propagation Society and Past Chairman of the IEEE Antenna Standards Committee. He is a member of the Board of Directors of the Antenna Measurements Techniques Association and is the author or co-author of more than 100 publications.